Article 1: The Testing Center of the School of Advanced Materials and Nanotechnology implements the opening and sharing system of large-scale instruments and equipment, in order to improve the use efficiency of large-scale instruments and equipment and scientifically allocate resources.
Article 2: different charging standards shall be implemented for different users, as shown in Table 1.
S/N |
User Type |
Charging |
Service |
Comments |
1 |
Super user (outside university) |
60 thousand / year |
8 hours of free time every week |
1. For charges according to samples, two samples = 1 hour; 2. The excess part is charged according to normal standard, and the remaining time every week will not accumulated. 3. There is no charge for teaching period and equipment debugging stage 4. Account cannot be shared. |
2 |
Super user (inside university) |
20 thousand / year |
3 |
Advanced user (outside university) |
30 thousand / year |
2 hours of free time every week |
4 |
Advanced user (inside university) |
10 thousand / year |
5 |
Ordinary user |
Charged according to normal standard |
Article 3: opening and sharing time of large-scale instruments and equipment
Platform tester: working hours
Independent tester: non-working hours
Article 4: appointment requirements
Users need to make appointment online or telephone in advance in the Shared platform appointment system. The instrument shall be appointed for at least one day in advance, and the appointment on the current day will not be accepted. When the user makes an appointment, it is necessary to tell the tester about the test conditions, basic components and consumables required. If the test cannot be carried out in time, the user should inform the Administrator 24 hours in advance to cancel the appointment; In case of absence to the test with active appointments, the wasted time will be recorded into test time for ordinary users, and be deducted from the free time next week for super users and advanced users.
Article 5: operation mode
Operator |
Instruments training charge |
Comments |
Platform tester |
Free of charge |
The training personnel can operate on the computer only after passing the assessment for the Administrators. If the training personnel fail to pass the assessment once, they need to pay the assessment fee again for another try. If you do not use the instrument for more than 3 months, you need to pay the assessment fee, and the Administrator can continue to use the instrument after passing the examination again. |
Independent tester |
Instrument |
Training fee |
Assessment fee |
SEM |
800 |
200 |
TEM |
1500 |
500 |
Article 6: use record
Each large instrument is equipped with a record book. Each user should truthfully register the actual use situation (such as machine time, sample number, user, etc.) after the experiment as the basis for annual benefit assessment of large-scale instruments and equipment. If the user is found not registering intentionally or failing to register truthfully, the Administrator has the right to punish the user according to the seriousness of the case. The Administrator shall audit the use records.
Article 7: test cost
Charging: It shall be registered according to the relationship of Student-Tutor, be charged according to students’ testing tutor account. For young teachers without students will be registered and charged according to the relationship of Young Teacher- Young Teacher.
Charge: super users and advanced users need to transfer the annual test fee into the test charge account of our School. Ordinary users will be charged according to the time or sample quantity, which shall be settled once every semester.
Labor fee: calculate the income of each instrument at the end of each year, and some of the income will be used as remuneration to the testers, which will be distributed pursuant to the workload of the testers.
Open and sharing Charging Method for Large-scale instruments and Equipment by School of Advanced Materials and Nanotechnology
S/N |
Instrument name |
Instrument model |
Charge standard (Yuan, inside School) |
Charge standard (Yuan, inside School) |
Charge standard (Yuan, inside School) |
1 |
Transmission Electron Microscope (TEM) |
JEM-2100F |
Conventional morphology 300 yuan / hour HRTEM/STEM/ EDS 400 yuan / hour |
Conventional morphology 400 yuan / hour HRTEM/STEM/ EDS 600 yuan / hour |
Conventional morphology 600 yuan / hour HRTEM/STEM/E DS 800 yuan / hour |
2 |
X-Ray Diffractometer (XRD) |
D8 Advance |
100 yuan / hour |
200 yuan / hour |
300 yuan / hour |
3 |
Automatic Gas Sorption Analyzer (BET) |
Autosorb-iQ |
90 yuan / sample |
120 yuan / sample |
150 yuan / sample |
4 |
Field Emission Scanning Electron Microscope (SEM) |
ApreoHiVac |
200 yuan / hour Gold spray 50 / time EDS 20 yuan / one |
300 yuan / hour Gold spray 50 / time EDS 30 yuan / one |
400 yuan / hour Gold spray 100 / time EDS 50 yuan / one |
5 |
Synchronous Thermal Analyzer (TGA / DSC) |
STA 449F5 |
100 yuan / sample |
150 yuan / sample |
300 yuan / sample |
6 |
UV / Vis / NIR Spectrophotometer |
UH4150 |
100 yuan / hour |
150 yuan / hour |
240 yuan / hour |
7 |
Inductively Coupled Plasma - Analytical Emission Spectrometer (ICP-AES) |
Avio 200 |
60 yuan / sample (not more than 3 elements) + 50 yuan for each added element |
100 yuan / sample (not more than 3 elements) + 50 yuan for each added element |
200 yuan / sample (not more than 3 elements) + 50 yuan for each added element |
8 |
Fourier Transform Infrared Spectrometer |
Nicolet iS 50 |
20 yuan / sample |
30 yuan / sample |
50 yuan / sample |
9 |
Laser Confocal Micro Raman Spectrometer |
inVia |
200 yuan / hour |
300 yuan / hour |
400 yuan / hour |
10 |
Ferroelectric Analyzer |
TF Analyzer 3000 |
100 yuan / hour |
150 yuan / hour |
200 yuan / hour |
11 |
Dielectric Impedance Analyzer |
BDS 50 |
80 yuan / hour |
120 yuan / hour |
200 yuan / hour |
12 |
Plasma Enhanced Atomic Layer Deposition System (ALD) |
Savannah G2 S200 |
100 yuan / hour |
200 yuan / hour |
300 yuan / hour |
13 |
Four Probes |
280SI |
60 yuan / hour |
100 yuan / hour |
200 yuan / hour |